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On the Interpretation of Ballistic Injection Velocity in Deeply Scaled MOSFETsYANG LIU; LUISIER, Mathieu; MAJUMDAR, Amlan et al.I.E.E.E. transactions on electron devices. 2012, Vol 59, Num 4, pp 994-1001, issn 0018-9383, 8 p.Article
