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Investigation and Comparison of Work Function Variation for FinFET and UTB SOI Devices Using a Voronoi ApproachCHOU, Shao-Heng; FAN, Ming-Long; PIN SU et al.I.E.E.E. transactions on electron devices. 2013, Vol 60, Num 4, pp 1485-1489, issn 0018-9383, 5 p.Article
