28136587
Results 1 to 1 of 1
Selection :
PVT variations aware low leakage INDEP approach for nanoscale CMOS circuitsVIJAY KUMAR SHARMA; PATTANAIK, Manisha; RAJ, Balwinder et al.Microelectronics and reliability. 2014, Vol 54, Num 1, pp 90-99, issn 0026-2714, 10 p.Article