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• 001 Exact sciences and technology.
  • 001B Physics
    • 001B60 Condensed matter: structure, mechanical and thermal properties. (See also 002A03G, 001D10, 001D09, 001D08B, 001B80A40, 001B30F40)
      • 001B60A Structure of solids and liquids; crystallography. (See also 001B80A30, 001B60H, 001B60D)
        • 001B60A16 Electron, ion, and scanning probe microscopy.
          • 001B60A16B Transmission, reflection and scanning electron microscopy(including EBIC).
          • 001B60A16C Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc..
          • 001B60A16F Field emission- and field-ion microscopy.
          • 001B60A16M Scanning Auger microscopy, photoelectron microscopy. (See also 001B00G78)

Title

• en : Electron, ion, and scanning probe microscopy.
• fr : Microscopies électronique, ionique et en champ proche.

SKOS Notation

001B60A16

In the plan

Pascal Classification Scheme