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• 001 Exact sciences and technology.
  • 001B Physics
    • 001B60 Condensed matter: structure, mechanical and thermal properties. (See also 002A03G, 001D10, 001D09, 001D08B, 001B80A40, 001B30F40)
      • 001B60A Structure of solids and liquids; crystallography. (See also 001B80A30, 001B60H, 001B60D)
        • 001B60A72 Defects and impurities in crystals; microstructure. (See also 001B60H35D, 001B60H, 001B60A80)
          • 001B60A72F Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.).

Title

• en : Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.).
• fr : Observation directe de dislocations et d'autres défauts (par piqûres d'attaque, décoration, microscopie électronique, topographie RX, etc.).

SKOS Notation

001B60A72F

In the plan

Pascal Classification Scheme