Two-band photoluminescence spectra from nanometre Si particle-embedded Si oxide films
- Autor
- MA, S. Y1
[1] Department of Physics, Northwest Normal University, Lanzhou 730070, China - Fuente
Surface and interface analysis. 2001, Vol 31, Num 9, pp 890-892 ; ref : 11 ref
- Editor
- Wiley, Chichester
- País de la publicación
- United Kingdom
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Etude expérimentale Matériau composite Nanostructure Photoluminescence Silicium oxyde Silicium Spectre absorption Spectre photoélectron RX
- Palabra clave (in)
- Experimental study Composite materials Nanostructures Photoluminescence Silicon oxides Silicon Absorption spectra X-ray photoelectron spectra
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66S Composite materials
- Disciplina
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 1108544
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/sia.1112 
https://dx.doi.org/10.1002/sia.1112
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