Summary of ISO/TC 201 Standard : VII ISO 15472 : 2001-surface chemical analysis-x-ray photoelectron spectrometers-calibration of energy scales
- Author
- SEAH, M. P1
[1] National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom - Source
Surface and interface analysis. 2001, Vol 31, Num 8, pp 721-723 ; ref : 3 ref
- CODEN
- SIANDQ
- ISSN
- 0142-2421
- Scientific domain
- General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Publisher
- Wiley, Chichester
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse chimique Energie liaison électronique Etalonnage Méthode analytique Norme ISO Spectre photoélectron RX Spectrométrie photoélectron
- Keyword (en)
- Chemical analysis Electron binding energy Calibration Analytical method ISO X-ray photoelectron spectra Photoelectron spectroscopy
- Keyword (es)
- Energía enlace electrónica Método analítico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G81 Electron, ion spectrometers and related techniques
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods
- Discipline
- Analytical chemistry Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1109584
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/sia.1076 
https://dx.doi.org/10.1002/sia.1076
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