STM observation of the 2 x 3 and c(2 x 6) structures on Ba/Si(100)
- Author
- OJIMA, Kaoru1 ; YOSHIMURA, Masamichi1 ; UEDA, Kazuyuki1
[1] Graduate School of Engineering, Toyota Technological Institute 2-12-1 Hisakata, Tempaku, Nagoya 468-8511, Japan - Source
Surface science. 2001, Vol 491, Num 1-2, pp 169-174 ; ref : 22 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Baryum Etude expérimentale Matériau semiconducteur Modèle structure STM Silicium Structure adsorption Structure surface Surstructure Ba Si
- Keyword (en)
- Barium Experimental study Semiconductor materials Structural models STM Silicon Adsorption structure Surface structure Superstructure
- Keyword (es)
- Estructura adsorción Superestructura
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1109800
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0039-6028(01)01392-9 
https://dx.doi.org/10.1016/S0039-6028(01)01392-9
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