Neural network-based L1-norm optimisation approach for fault diagnosis of nonlinear circuits with tolerance
- Author
- HE, Y1 ; SUN, Y2
[1] School of Electrical and Information Engineering, Hunan University, Changsha, 410082, China
[2] Department of Electronic, Communication and Hoctrica Engineering, Faculty of Engineering and Information Sciences, University of Hertfordshire, Hatfield AL10 9AB, United Kingdom - Source
IEE proceedings. Circuits, devices and systems. 2001, Vol 148, Num 4, pp 223-228 ; ref : 26 ref
- ISSN
- 1350-2409
- Scientific domain
- Electronics
- Publisher
- Institution of Electrical Engineers, Stevenage
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Circuit analogique Circuit non linéaire Diagnostic panne Optimisation Réseau neuronal Tolérance faute
- Keyword (en)
- Analog circuit Non linear circuit Fault diagnostic Optimization Neural network Fault tolerance
- Keyword (es)
- Circuito analógico Circuito no lineal Diagnóstico pana Optimización Red neuronal Tolerancia falta
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G03 Neural networks
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1118300
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1049/ip-cds:20010418 
https://dx.doi.org/10.1049/ip-cds:20010418
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