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Modeling and performances of a Polarization Active Imager at λ = 806 nm

Author
BREUGNOT, S1 ; CLEMENCEAU, P1
[1] Thomson-CSF Optronique, Rue Guynemer BP 55, 78283 Guyancourt, France
Conference title
Laser radar technology and applications IV (Orlando FL, 6-9 April 1999)
Conference name
Laser radar technology and applications. Conference (Orlando FL 1999-04-06)
Author (monograph)
Kamerman, Gary W (Editor); Werner, Christian (Editor)
International Society for Optical Engineering, Bellingham WA, United States (Organiser of meeting)
European Optical Society, Orsay, France (Organiser of meeting)
Source

SPIE proceedings series. 1999, pp 449-460 ; ref : 10 ref

ISBN
0-8194-3181-8
Scientific domain
Electronics; Geology; Optics; Physics; Telecommunications
Publisher
SPIE, Bellingham WA
Publication country
International
Document type
Conference Paper
Language
English
Keyword (fr)
Détection cible Etude expérimentale Formation image Laser semiconducteur Matrice Mueller Polarimétrie Potentiel polarisation Système actif
Keyword (en)
Target detection Experimental study Image forming Semiconductor lasers Mueller matrix Polarimetry Polarization potential Active system
Keyword (es)
Detección blanco Matriz Mueller Potencial polarización Sistema activo
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B55 Lasers / 001B40B55P Semiconductor lasers; laser diodes

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79L Scanners, image intensifiers, and image converters

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79P Imaging detectors and sensors

Discipline
Metrology Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1171642

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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