Real-space dynamical simulation for electron microdiffraction effects
- Autor
- DU, K1 ; WANG, Y. M1 ; YE, H. Q1 ; PAN, H. Y2
[1] Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110015, China
[2] Central Iron and Steel Research Institute, Beijing 100081, China - Fuente
Ultramicroscopy. 1999, Vol 80, Num 2, pp 99-107 ; ref : 14 ref
- CODEN
- ULTRD6
- ISSN
- 0304-3991
- Campo Científico
- Cell biology, histology; Crystallography; Physics
- Editor
- Elsevier Science, Amsterdam
- País de la publicación
- Netherlands
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Cristal Diffraction électron Etude expérimentale Multicoupe STEM Simulation Système dynamique
- Palabra clave (in)
- Crystals Electron diffraction Experimental study Multislice STEM Simulation Dynamical systems
- Palabra clave (es)
- Multicorte
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy
- Disciplina
- Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 1192807
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0304-3991(99)00100-X 
https://dx.doi.org/10.1016/S0304-3991(99)00100-X
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