Residual stresses in thermal barrier coatings : effects of interface asperity curvature/height and oxide thickness
- Author
- HSUEH, C.-H1 ; FULLER, E. R2
[1] Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6068, United States
[2] National Institute of Standards and Technology, Gaithersburg, MD 20899, United States - Source
Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2000, Vol 283, Num 1-2, pp 46-55 ; ref : 23 ref
- ISSN
- 0921-5093
- Scientific domain
- Crystallography; Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Barrière thermique Contrainte résiduelle Etude théorique Interface solide solide Microstructure Méthode élément fini Revêtement Simulation numérique
- Keyword (en)
- Thermal barriers Residual stresses Theoretical study Solid-solid interfaces Microstructure Finite element method Coatings Digital simulation
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35G Mechanical and acoustical properties; adhesion
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1329530
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0921-5093(00)00743-7 
https://dx.doi.org/10.1016/S0921-5093(00)00743-7
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