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Orientation and bonding of thiophene and 2,2'-bithiophene on Ag( 111) : a combined near edge extended X-ray absorption fine structure and Xα scattered-wave study

Author
VÄTERLEIN, P1 ; SCHMELZER, M1 ; TABORSKI, J1 ; KRAUSE, T1 ; VICZIAN, F1 ; BÄSSLER, M1 ; FINK, R1 ; UMBACH, E1 ; WURTH, W2
[1] Experimentelle Physik II, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany
[2] Physik-Department E20, Technische Universität München, James-Franck-Str., 85747 Garching, Germany
Source

Surface science. 2000, Vol 452, Num 1-3, pp 20-32 ; ref : 48 ref

CODEN
SUSCAS
ISSN
0039-6028
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics; Polymers, paint and wood industries
Publisher
Elsevier Science, Amsterdam / Elsevier Science, Lausanne / Elsevier Science, New York, NY
Publication country
Netherlands
Document type
Article
Language
English
Keyword (fr)
Argent EXAFS Etude expérimentale Méthode Xalpha Polymérisation Structure adsorption Structure surface Structure électronique TDS Thiophène dérivé Thiophène Ag Composé organique Métal transition
Keyword (en)
Silver EXAFS Experimental study Xalpha method Polymerization Adsorption structure Surface structure Electronic structure TDS Thiophene derivatives Thiophene Organic compounds Transition elements
Keyword (es)
Método Xalfa Estructura adsorción Tiofeno derivado
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C20 Surface and interface electron states / 001B70C20H Impurity and defect levels; energy states of adsorbed species

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Pacs
7320H Impurity and defect levels; energy states of adsorbed species

Discipline
Metals. Metallurgy Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1334562

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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