Pascal and Francis Bibliographic Databases

Help

Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=13482930

Export

Selection :

MBE grown short-period (Sim/Gen)N superlattices (SSLs) and its effect on the growth of uniform Si0.75Ge0.25/(SSLs)/Si(001) systems

Author
RAHMAN, M. M1 ; KURUMATANI, K1 ; MATADA, H1 ; TAMBO, T1 ; TATSUYAMA, C1
[1] Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama University, 3190-Gofuku, Toyama 930-8555, Japan
Conference title
European Materials Research Society (E-MRS) 2001, Spring Meeting, Symposium D: Second International Conference on Silicon Epitaxy and Heterostructures, Strasbourg, France, June 4-8th 2001
Conference name
European Materials Research Society (E-MRS), Spring Meeting, Symposium D (E-MRS), Spring Meeting, Symposium D (Strasbourg 2001-06-04) = International Conference on Silicon Epitaxy and Heterostructures (2 ; Strasbourg 2001-06-04)
Author (monograph)
KASPER, E (Editor); EISELE, I (Editor); PARKER, E. H. C (Editor)
European Materials Research Society, Strasbourg, France (Funder/Sponsor)
Source

Materials science & engineering. B, Solid-state materials for advanced technology. 2002, Vol 89, Num 1-3, pp 252-256 ; ref : 8 ref

ISSN
0921-5107
Scientific domain
Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Keyword (fr)
Alliage binaire Contrainte résiduelle Couche mince Couche épitaxique Croissance cristalline Dislocation Epitaxie jet moléculaire Etude expérimentale Germanium alliage Germanium Hétérostructure Microscopie force atomique Rugosité Semiconducteur Silicium alliage Silicium Superréseau Surface Ge Si Ge Si0,75Ge0,25 Si Non métal
Keyword (en)
Binary alloys Residual stresses Thin films Epitaxial layers Crystal growth Dislocations Molecular beam epitaxy Experimental study Germanium alloys Germanium Heterostructures Atomic force microscopy Roughness Semiconductor materials Silicon alloys Silicon Superlattices Surfaces Nonmetals
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15H Molecular, atomic, ion, and chemical beam epitaxy

Pacs
8115H Molecular, atomic, ion, and chemical beam epitaxy

Discipline
Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
13482930

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Access to the document

Searching the Web