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Comparison between SEM and TEM imaging techniques to determine grain-boundary wetting in ceramic polycrystals : Structure and properties of advanced nitrides and electronic nitrides

Author
KLEEBE, Hans-Joachim1
[1] Metallurgical and Materials Engineering Department, Colorado School of Mines, Golden, Colorado 80401, United States
Conference name
Structure and Properties of Advanced Nitrides and Electronic Nitrides. Symposium A4 (Indianapolis, IN 2001-04-22)
Source

Journal of the American Ceramic Society. 2002, Vol 85, Num 1, pp 43-48 ; ref : 45 ref

CODEN
JACTAW
ISSN
0002-7820
Scientific domain
Chemical industry parachemical industry
Publisher
Blackwell, Malden,MA
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Contraste image Couche interfaciale Couche mince Céramique Etude expérimentale Haute résolution Image réticulaire Joint grain Microscopie électronique balayage Microscopie électronique transmission Mouillage Méthode étude Polycristal Silicium carbure Silicium nitrure C Si N Si Si3N4 SiC Composé minéral
Keyword (en)
Image contrast Interfacial layer Thin films Ceramics Experimental study High-resolution methods Lattice image Grain boundaries Scanning electron microscopy Transmission electron microscopy Wetting Investigation method Polycrystals Silicon carbides Silicon nitrides Inorganic compounds
Keyword (es)
Imagen contraste Capa interfacial Imagen reticular Método estudio
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72F Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72M Grain and twin boundaries

Pacs
6172F Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)

Pacs
6172M Grain and twin boundaries

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
13488867

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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