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Impurity effects on the slippage of nonsuperfluid helium films

Author
NISHINO, T1 ; WATANABE, T1 ; HIEDA, M1 ; SUZUKI, M1 ; WADA, N2 ; TORII, K3
[1] Dept. of Applied Physics and Chemistry, Univ. of Electro-Communications, Chofu, Tokyo 182-8585, Japan
[2] Graduate School of Science, Nagoya University, Chikusa, Nagoya 464-8602, Japan
[3] National Institute of Advanced Industrial Science and Technology, Miyagi-ku, Sendai 983-8551, Japan
Conference title
Special Issue: Proceedings of the International Symposium on Quantum Fluids and Solids, QFS 2001
Conference name
QFS 2001: Quantum Fluids and Solids. Symposium (Konstanz 2001-07-22)
Source

Journal of low temperature physics. 2002, Vol 126, Num 1-2, pp 397-402 ; ref : 6 ref

CODEN
JLTPAC
ISSN
0022-2291
Scientific domain
Mechanics acoustics; Metallurgy, welding; Condensed state physics
Publisher
Springer, Heidelberg
Publication country
Germany
Document type
Conference Paper
Language
English
Keyword (fr)
Addition azote Adsorption Célérité son Energie activation Equation Arrhenius Etude expérimentale Film hélium Frottement Glissement Hélium 4 Impureté Propriété mécanique Ultrason He
Keyword (en)
Nitrogen additions Adsorption Sound velocity Activation energy Arrhenius equation Experimental study Helium films Friction Slip Helium 4 Impurities Mechanical properties Ultrasonic waves
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60G Quantum fluids and solids; liquid and solid helium / 001B60G70 Films (including physical adsorption)

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
13494626

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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