Statistical treatment of insulation failure data with the application of simplified regression method in the high-voltage laboratory
- Author
- AGORIS, D1 ; KARAGIANNOPOULOS, C. G2 ; SPINAKIS, A3 ; PSOMOPOULOS, C. S2
[1] Electrical and Computer Engineering Department, University of Patras, Greece
[2] Electrical and Computer Engineering Department, National Technical University of Athens, Greece
[3] Department of Management Science, Aegean University, Greece - Source
International journal of modelling & simulation. 2002, Vol 22, Num 1, pp 1-7 ; ref : 12 ref
- CODEN
- IMSIEK
- ISSN
- 0228-6203
- Scientific domain
- Electronics
- Publisher
- Acta Press, Anaheim, CA
/
Acta Press, Calgary, AB
/
Acta Press, Zürich
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse régression Durabilité Défaillance Etude comparative Isolateur haute tension Loi Weibull Maximum vraisemblance Vieillissement
- Keyword (en)
- Regression analysis Durability Failures Comparative study High voltage insulator Weibull distribution Maximum likelihood Ageing
- Keyword (es)
- Análisis regresión Durabilidad Fallo Estudio comparativo Aislador alta tensión Ley Weibull Maxima verosimilitud Envejecimiento
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05G Various equipment and components / 001D05G05 Insulators
- Discipline
- Electrical engineering. Electroenergetics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 13643703
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/02286203.2002.11442218 
https://dx.doi.org/10.1080/02286203.2002.11442218
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