Control of polarity of heteroepitaxial ZnO films by interface engineering
- Author
- HONG, Soon-Ku1 ; HANADA, Takashi1 ; CHEN, Yefen1 ; KO, Hang-Ju1 ; YAO, Takafumi1 ; IMAI, Daisuke2 ; ARAKI, Kiyoaki2 ; SHINOHARA, Makoto2
[1] Institute for Materials Research, Tohoku University, Sendai 980-8677, Japan
[2] Surface Analysis and Semiconductor Equipment Division, Shimadzu Co., Kanagawa 259-1304, Japan - Conference title
- Proceedings of the Eighth International Conference on the Formation of Semiconductor Interfaces, Sapporo, Japan, June 10-15, 2001
- Conference name
- ICFSI-8 International Conference on the Formation of Semiconductor Interfaces (8 ; Sapporo 2001-06-10)
- Author (monograph)
- OKUMURA, Tsugunori (Editor)1 ; FUKUI, Takashi (Editor); HASEGAWA, Hideki (Editor)
The Japan Society of Applied Physics, Japan (Funder/Sponsor)
Ministry of Education, Culture, Sports, Science and Technology ; The International Scientific Exchange Program, Japan (Funder/Sponsor)
Hokkaido University ; Research Center for Integrated Quantum Electronics (RCIQE), Japan (Funder/Sponsor)
[1] Department of Electrical Engineering, Tokyo Metropolitan University, Minami-ohsawa, Hachioji, Tokyo 192 0397, Japan - Source
Applied surface science. 2002, Vol 190, Num 1-4, pp 491-497 ; ref : 7 ref
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Analyse diffusion ion Composé binaire Couche interfaciale Couche mince Gallium nitrure Hétérostructure Inversion polarité Magnésium oxyde Microscopie électronique transmission Polarité Semiconducteur Structure interface Zinc oxyde Composé minéral Ga N GaN Mg O MgO Métal transition composé O Zn ZnO
- Keyword (en)
- Ion scattering analysis Binary compounds Interfacial layer Thin films Gallium nitrides Heterostructures Polarity inversion Magnesium oxides Transmission electron microscopy Polarity Semiconductor materials Interface structure Zinc oxides
- Keyword (es)
- Capa interfacial Inversión polaridad Polaridad
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35C Interface structure and roughness
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 13725250
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0169-4332(01)00924-2 
https://dx.doi.org/10.1016/S0169-4332(01)00924-2
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