The influence of counterface materials and humidity on the tribological behavior of arc ion plated TiN films
- Author
- YOON, Seog-Young1 ; KANG, Myung-Chang2 ; KWON, Sik-Chol3 ; KWANG HO KIM1
[1] School of Materials Science and Engineering, Pusan National University, Pusan 609-735, Korea, Republic of
[2] School of Mechanical Engineering, Pusan National University, Pusan 609-735, Korea, Republic of
[3] Surface Engineering Department, Korea Institute of Machinery & Materials, Changwon 641-010, Korea, Republic of - Source
Surface & coatings technology. 2002, Vol 157, Num 2-3, pp 144-150 ; ref : 19 ref
- CODEN
- SCTEEJ
- ISSN
- 0257-8972
- Scientific domain
- General chemistry, physical chemistry; Metallurgy, welding
- Publisher
- Elsevier, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Acier Coefficient frottement Couche mince Etude expérimentale Humidité Microscopie électronique balayage Placage ionique Propriété mécanique Titane nitrure Tribologie Usure
- Keyword (en)
- Steels Friction factor Thin films Experimental study Humidity Scanning electron microscopy Ion plating Mechanical properties Titanium nitrides Tribology Wear
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic / 001B60H60B Mechanical and acoustical properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 13800553
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0257-8972(02)00145-7 
https://dx.doi.org/10.1016/S0257-8972(02)00145-7
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