Determination of the normalized Jones matrix of elliptical retarder
- Author
- BEREZHNA, Svitlana1 ; BEREZHNYY, Ihor2 ; TAKASHI, Masahisa2
[1] Physics Department, Emory University, Atlanta, GA 30322-2430, United States
[2] Department of Mechanical Engineering, Aoyama Gakuin University, Tokyo 157-0071, Japan - Conference title
- Experimental mechanics (Singapore, 29 November - 1 December 2000)
- Conference name
- International conference on experimental mechanics (2 ; Singapore 2000-11-29)
- Author (monograph)
- Fook Siong Chau (Editor); Chenggen Quan (Editor)
International Society for Optical Engineering, Bellingham WA, United States (Organiser of meeting) - Source
SPIE proceedings series. 2001, pp 129-134 ; ref : 8 ref
- ISBN
- 0-8194-3998-3
- Scientific domain
- Electronics; Mechanics acoustics; Metrology and instrumentation; Optics; Physics; Telecommunications
- Publisher
- SPIE, Bellingham WA
- Publication country
- International
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Compensateur optique Image numérique Mesure contrainte Mesure optique Modèle 3 dimensions Photoélasticité Polarimètre Polarisation elliptique Retardateur optique Traitement image Transformation Fourier discrète
- Keyword (en)
- Optical compensator Digital image Stress measurement Optical measurement Three dimensional model Photoelasticity Polarimeters Elliptic polarization Optical retarder Image processing Discrete Fourier transforms
- Keyword (es)
- Compensador óptico Imagen numérica Medida óptica Modelo 3 dimensiones Polarización elíptica Retardador óptico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H20 Optical properties of bulk materials and thin films / 001B70H20H Piezo-, elasto-, acoustooptical, and photoacoustic effects
- Discipline
- Metrology Physics : optics Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 14044777
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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