Micro-mechanics experimental study for the interphase of composite materials
- Author
- JINLONG CHEN1 ; YUWEN QIN1 ; RI QU1 ; YANQING WANG1
[1] Dept. of Mechanics, Tianjin University, Tianjin 300072, China - Conference title
- Experimental mechanics (Singapore, 29 November - 1 December 2000)
- Conference name
- International conference on experimental mechanics (2 ; Singapore 2000-11-29)
- Author (monograph)
- Fook Siong Chau (Editor); Chenggen Quan (Editor)
International Society for Optical Engineering, Bellingham WA, United States (Organiser of meeting) - Source
SPIE proceedings series. 2001, pp 248-251 ; ref : 8 ref
- ISBN
- 0-8194-3998-3
- Scientific domain
- Electronics; Mechanics acoustics; Metrology and instrumentation; Optics; Physics; Telecommunications
- Publisher
- SPIE, Bellingham WA
- Publication country
- International
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Bilame Diffusion thermique Etude expérimentale Image numérique Interphase Matériau composite Mesure déformation Mesure déplacement Micromécanique Modèle microscopique Métrologie Pixel Speckle Système mesure
- Keyword (en)
- Bimetals Thermal diffusion Experimental study Digital image Interphase Composite materials Strain measurement Displacement measurement Micromechanics Microscopic model Metrology Pixel Speckles Measurement systems
- Keyword (es)
- Imagen numérica Interfase Modelo microscópico Pixel
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G05 Computers in experimental physics / 001B00G05P Image processing
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G10 Mechanical instruments, equipment and techniques / 001B00G10P Instruments for strain, force and torque
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30M Speckle and moire patterns
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A05 Specific materials / 001B80A05Z Other materials
- Discipline
- Metrology Physics : optics Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 14044790
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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