Elliptically polarized white light photoviscoelastic technique and its application
- Author
- YONEYAMA, S1 ; TAKASHI, M2
[1] Department of Opto-mechatronics, Wakayama University, 930 Sakaedani, Wakayama 640-8510, Japan
[2] Department of Mechanical Engineering, Aoyama Gakuin University, 6-16-1 Chitosedai, Setagaya, Tokyo 157-8572, Japan - Conference title
- Experimental mechanics (Singapore, 29 November - 1 December 2000)
- Conference name
- International conference on experimental mechanics (2 ; Singapore 2000-11-29)
- Author (monograph)
- Fook Siong Chau (Editor); Chenggen Quan (Editor)
International Society for Optical Engineering, Bellingham WA, United States (Organiser of meeting) - Source
SPIE proceedings series. 2001, pp 150-155 ; ref : 14 ref
- ISBN
- 0-8194-3998-3
- Scientific domain
- Electronics; Mechanics acoustics; Metrology and instrumentation; Optics; Physics; Telecommunications
- Publisher
- SPIE, Bellingham WA
- Publication country
- International
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Facteur intensité contrainte Lumière blanche Lumière polarisée Mesure contrainte Mesure optique Photoélasticité Polarisation elliptique Propagation fissure Viscoélasticité
- Keyword (en)
- Stress intensity factor White light Polarized light Stress measurement Optical measurement Photoelasticity Elliptic polarization Crack propagation Viscoelasticity
- Keyword (es)
- Factor intensidad tensión Luz blanca Luz polarizada Medida óptica Fotoelasticidad Polarización elíptica Propagación fisura Viscoelasticidad
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40F Solid mechanics / 001B40F30 Structural and continuum mechanics / 001B40F30R Measurement and testing methods
- Discipline
- Physics : solid mechanics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 14044834
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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