Large deflection analysis of a pre-stressed annular plate with a rigid boss under axisymmetric loading
- Author
- SU, Y. H1 ; CHEN, K. S2 ; ROBERTS, D. C3 ; SPEARING, S. M4
[1] Department of Mechanical Engineering, State University of New York at Stony Brook, United States
[2] Department of Mechanical Engineering, National Cheng-Kung University, Tainan, Taiwan, Province of China
[3] Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, United States
[4] Department of Aeronautics and Astronautics, Massachusetts Institute of Technology, Cambridge, MA, United States - Source
Journal of micromechanics and microengineering (Print). 2001, Vol 11, Num 6, pp 645-653 ; ref : 11 ref
- ISSN
- 0960-1317
- Scientific domain
- Electronics; Mechanical engineering
- Publisher
- Institute of Physics, Bristol
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Charge axisymétrique Conception système Couche limite Dispositif microélectromécanique Dispositif électromécanique Déflexion Effet dimensionnel Flèche Grande déformation Intégration numérique Membrane Microusinage Miniaturisation Modélisation Plaque annulaire Propriété matériau Précontrainte Symétrie axiale
- Keyword (en)
- Axisymmetric load System design Boundary layer Microelectromechanical device Electromechanical device Deflection Size effect Deflection(deformation) High strain Numerical integration Membrane Micromachining Miniaturization Modeling Annular plate Properties of materials Prestress Axial symmetry
- Keyword (es)
- Carga axisimétrica Concepción sistema Capa límite Dispositivo microelectromecánico Dispositivo electromecánico Deflección Efecto dimensional Torcedura Gran deformación Integración numérica Membrana Micromaquinado Miniaturización Modelización Placa anular Propiedad material Pretensado Simetría axial
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F21 Micro- and nanoelectromechanical devices (mems/nems)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 14076152
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0960-1317/11/6/305 
https://dx.doi.org/10.1088/0960-1317/11/6/305
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