Dynamical elemental mapping at elevated temperature using plasmon loss peaks in electron energy loss spectroscopy
- Author
- SASAKI, Katsuhiro1 ; TSUKIMOTO, Susumu1 2 ; KONNNO, Minoru2 ; KAMINO, Takeo3 ; SAKAL, Hiroyasu1
[1] Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan
[2] Now at Max-Planck Institute für Metallforschung, Stuttgart, 4H16, Germany
[3] Techno Research lab. Hitachi Science Systems. Ltd., Hitachinaka 312-8504, Japan - Source
Nippon Kinzoku Gakkaishi (1952). = Journal of the Japan Institute of Metals (1952). 2001, Vol 65, Num 5, pp 338-342 ; ref : 14 ref
- CODEN
- NIKGAV
- ISSN
- 0021-4876
- Scientific domain
- Metallurgy, welding
- Publisher
- Nippon Kinzoku Gakkai, Sendai
- Publication country
- Japan
- Document type
- Article
- Language
- Japanese
- Keyword (fr)
- Dispersion plasmon Etude expérimentale Interface Microscopie électronique transmission Migration Oxygène Propriété interface Réduction chimique Silicium oxyde Silicium Spectrométrie dispersive
- Keyword (en)
- Plasmon dispersion Experimental study Interfaces Transmission electron microscopy Migration Oxygen Interface properties Chemical reduction Silicon oxides Silicon Dispersive spectrometry
- Keyword (es)
- Dispersión plasmón Propiedad interfase Espectrometría dispersiva
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy / 001B60A16B Transmission, reflection and scanning electron microscopy(including ebic)
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 14076481
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.2320/jinstmet1952.65.5_338 
https://dx.doi.org/10.2320/jinstmet1952.65.5_338
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