Potential and impedance imaging of polycrystalline BiFeO3ceramics
- Author
- KALININ, Sergei V1 ; SUCHOMEL, Matthew R1 ; DAVIES, Peter K1 ; BONNELL, Dawn A1
[1] Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States - Source
Journal of the American Ceramic Society. 2002, Vol 85, Num 12, pp 3011-3017, 7 p ; ref : 41 ref
- CODEN
- JACTAW
- ISSN
- 0002-7820
- Scientific domain
- Chemical industry parachemical industry
- Publisher
- Blackwell, Malden,MA
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Bismuth oxyde Capacité électrique Composé ternaire Dispositif expérimental Etude expérimentale Fer oxyde Formation image Impédance électrique Joint grain Microscopie champ proche Microscopie Méthode étude Polycristal Potentiel surface Bi O Fe BiFeO3 Composé minéral Métal transition composé
- Keyword (en)
- Bismuth oxides Capacitance Ternary compounds Experimental device Experimental study Iron oxides Imaging Electric impedance Grain boundaries Scanning probe microscopy Microscopy Investigation method Polycrystals Surface potential Inorganic compounds Transition element compounds
- Keyword (es)
- Dispositivo experimental Método estudio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70G Dielectrics, piezoelectrics, and ferroelectrics and their properties / 001B70G22 Dielectric properties of solids and liquids
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 14678075
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1111/j.1151-2916.2002.tb00571.x 
https://dx.doi.org/10.1111/j.1151-2916.2002.tb00571.x
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