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A novel lattice-spacing comparator with resolution of 10-8

Author
XIAOWEI ZHANG1 ; SUGIYAMA, Hiroshi1 ; ANDO, Masami1 ; IMAI, Yoshihiko2 ; YODA, Yoshitaka2
[1] Photon Factory, High Energy Acceletor Researchch Organization (KEK), Tsukuba, Ibaraki 305-0801 japan, Spring-8, Hyogo 679-5198, Japan
[2] Japan Synchrotron Radiation ResearchInstitute (JASRI), Spring-8, Hyogo 679-5198, Japan
Source

Journal of applied crystallography. 2003, Vol 36, pp 188-192, 5 p ; 2 ; ref : 16 ref

CODEN
JACGAR
ISSN
0021-8898
Scientific domain
Crystallography
Publisher
Blackwell, Oxford
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Appareillage Comparateur Diffraction RX Distance interréticulaire Etude expérimentale Haute résolution Méthode mesure Réflexion Bragg Résolution structurale Semiconducteur Silicium Si Non métal
Keyword (en)
Instrumentation Comparator XRD Interplanar spacing Experimental study High-resolution methods Measuring methods Bragg reflection Structure resolution Semiconductor materials Silicon Nonmetals
Keyword (es)
Comparador Distancia interreticular Resolución estructural
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering / 001B60A10N Single-crystal and powder diffraction

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
14678137

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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