Depolarization corrections to the coercive field in thin-film ferroelectrics
- Autor
- DAWBER, M1 ; CHANDRA, P2 ; LITTLEWOOD, P. B3 ; SCOTT, J. F1
[1] Symetrix Centre for Ferroics, Earth Sciences Department, Downing Street, University of Cambridge, Cambridge CB2 3EQ, United Kingdom
[2] Chandra Tech Consulting LLC, 123 Harper Street, Highland Park, NJ 08904, United States
[3] Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, United Kingdom - Fuente
Journal of physics. Condensed matter (Print). 2003, Vol 15, Num 24, pp L393-L398 ; ref : 19 ref
- CODEN
- JCOMEL
- ISSN
- 0953-8984
- Campo Científico
- Crystallography; Metallurgy, welding; Condensed state physics
- Editor
- Institute of Physics, Bristol
- País de la publicación
- United Kingdom
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Couche mince Dépolarisation Epaisseur Etude théorique Ferroélectricité Force coercitive Loi échelle Matériau ferroélectrique Méthode semiempirique
- Palabra clave (in)
- Thin films Depolarization Thickness Theoretical study Ferroelectricity Coercive force Scaling laws Ferroelectric materials Semiempirical method
- Palabra clave (es)
- Método semiempírico
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70G Dielectrics, piezoelectrics, and ferroelectrics and their properties / 001B70G80 Ferroelectricity and antiferroelectricity
- Disciplina
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 14885854
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0953-8984/15/24/106 
https://dx.doi.org/10.1088/0953-8984/15/24/106
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