Analysis of the atomic structure of interfaces and defects in wurtzite nitride semiconductors
- Autor
- RUTERANA, P1 ; NOUET, G1
[1] ESCTM-CRLSMAT, Institut des Sciences de la Matière et du Rayonnement, 6 Bd. Maréchal Juin, 14050 Caen, France - Titulo de la conferencia
- EMC 2002: XIth International Conference on Electron Microscopy of Solids, May 19-23, 2002 in Krynica, Poland
- Nombre de la conferencia
- EMC 2002 International Conference on Electron Microscopy of Solids (11 ; Krynica 2002-05-19)
- Autor ( monografía)
- BIELANSKA, Elzbieta (Editor)1 ; DUTKIEWICZ, Jan (Editor)1 ; ZIEBA, Pawel (Editor)1
Polish Materials Society ; State Committee for Scientific Research, Poland (Funder/Sponsor)
Polish Academy of Sciences ; Committee on Materials Science ; Microscopy Section, Poland (Funder/Sponsor)
[1] Polish Academy of Sciences, Institute of Metallurgy and Materials Science, Cracow, Poland - Fuente
Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 249-252, 4 p ; ref : 19 ref
- CODEN
- MCHPDR
- ISSN
- 0254-0584
- Campo Científico
- Chemistry; Metallurgy, welding; Physics
- Editor
- Elsevier, Lausanne
- País de la publicación
- Switzerland
- Tipo de documento
- Conference Paper
- Idioma
- English
- Palabra clave (fr)
- Analyse Défaut Interface Microscopie électronique Nitrure Semiconducteur Structure atomique Structure interface
- Palabra clave (in)
- Analysis Defects Interfaces Electron microscopy Nitrides Semiconductor materials Atomic structure Interface structure
- Palabra clave (es)
- Análisis
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy
- Disciplina
- Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 15085333
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0254-0584(02)00567-9 
https://dx.doi.org/10.1016/S0254-0584(02)00567-9
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