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Characterization and role of hydrogen in nc-Si:H

Author
ITOH, T1 ; YAMAMOTO, K1 ; USHIKOSHI, K1 ; NONOMURA, S2 ; NITTA, S1
[1] Department of Electrical Engineering, Gifu University, 1-1 Yanaido, Gifu 501-1193, Japan
[2] Environment and Renewable Energy Systents, Graduate School of Engineering, Gifu University, 1-1 Yanaido, Gifu 501-1193, Japan
Conference title
Proceeding of the 18th International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology (ICAMS 18), Snorwbird, UT, USA, August 23-27 1999. Part A
Conference name
ICAMS 18 International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology (18 ; Snowbird, UT 1999-08-23)
Author (monograph)
WAGNER, Sigurd (Editor)1 ; TAYLOR, P. Craig (Editor)2 ; STREET, Robert A (Editor)3 ; SCHIFF, Eric A (Editor)4
[1] Department of Electrical Engineering, Princeton University, Princeton, NJ, United States
[2] Department of Physics, University of Utah, Salt Like City, UT, United States
[3] Xerox Palo Alto Research Center, Palo Alto, CA, United States
[4] Department of Physics, Syracuse University, Syracuse, NY, United States
Source

Journal of non-crystalline solids. 2000, Vol 266-69, pp 201-205, 5 p ; a ; ref : 15 ref

CODEN
JNCSBJ
ISSN
0022-3093
Scientific domain
Crystallography; Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Keyword (fr)
Cristallinité Densité Déconvolution Etat amorphe Joint grain Liaison hydrogène Mode vibration Méthode PECVD Recuit Silicium 63 Si
Keyword (en)
Crystallinity Density Deconvolution Amorphous state Grain boundaries Hydrogen bonds Vibrational modes PECVD Annealing Silicon
Keyword (es)
Cristalinidad
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60C Lattice dynamics

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
15711663

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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