Scanning differential spreading resistance microscopy on actively driven buried heterostructure multiquantum-well lasers
- Author
- BAN, Dayan1 2 ; SARGENT, E. H1 ; DIXON-WARREN, St. J3
[1] Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON M5S 3G4, Canada
[2] Institute for Microstructural Sciences, National Research Council, Ottawa, ON K1A 0R6, Canada
[3] Chipworks, Ottawa, ON K2H 5B7, Canada - Source
IEEE journal of quantum electronics. 2004, Vol 40, Num 7, pp 865-870, 6 p ; ref : 34 ref
- CODEN
- IEJQA7
- ISSN
- 0018-9197
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Etude expérimentale Hétérostructure enterrée Laser enterré Laser puits quantique Laser semiconducteur Microscopie champ proche Microscopie force atomique Puits quantique multiple Résistance électrique 4255P
- Keyword (en)
- Experimental study Buried heterostructures Buried laser Quantum well lasers Semiconductor lasers Scanning probe microscopy Atomic force microscopy Multiple quantum well Resistors
- Keyword (es)
- Láser enterrado Pozo cuántico múltiple
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B55 Lasers / 001B40B55P Semiconductor lasers; laser diodes
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 15897613
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/JQE.2004.830174 
https://dx.doi.org/10.1109/JQE.2004.830174
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