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Summary of ISO/TC 201 Technical Report: ISO/TR 19319: 2003: Surface chemical analysis: Auger electron spectroscopy and x-ray photoelectron spectroscopy: Determination of lateral resolution, analysis area and sample area viewed by the analyser

Author
POWELL, C. J1
[1] Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8370, United States
Source

Surface and interface analysis. 2004, Vol 36, Num 7, pp 666-667, 2 p ; ref : 1 ref

CODEN
SIANDQ
ISSN
0142-2421
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
AES Auger electron spectroscopy ISO International Organization for Standardization XPS analysis area lateral resolution sample area viewed by the analyser x-ray photoelectron spectroscopy
Keyword (fr)
Analyse chimique Analyse surface Spectre photoélectron RX Spectrométrie Auger
Keyword (en)
Chemical analysis Surface analysis X-ray photoelectron spectra AES
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
15925143

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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