Surface excitations in electron backscattering from silicon surfaces
- Author
- ZEMEK, J1 ; JIRICEK, P1 ; LESIAK, B2 ; JABLONSKI, A2
[1] Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, Cukrovarnicka 10, 162 53 Prague, Czech Republic
[2] Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01-224 Warszawa, Poland - Source
Surface science. 2004, Vol 562, Num 1-3, pp 92-100, 9 p ; ref : 28 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Electron-solid interactions; Electron-solid scattering and transmission elastic; Electron-solid scattering and transmission inelastic; Monte Carlo simulations; Electron bombardment; Silicon
- Keyword (fr)
- Cuivre Diffusion électron Emission électronique Libre parcours moyen Métal transition Méthode Monte Carlo Méthode semiempirique Or Rétrodiffusion Silicium Simulation numérique Spectre photoélectron RX Spectre électron Spectrométrie Auger Spectrométrie perte énergie électron Au Cu Si
- Keyword (en)
- Copper Electron scattering Electron emission Mean free path Transition elements Monte Carlo methods Semiempirical method Gold Backscattering Silicon Digital simulation X-ray photoelectron spectra Electron spectra AES EEL spectroscopy
- Keyword (es)
- Difusión electrón Método semiempírico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 15949833
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.susc.2004.05.093 
https://dx.doi.org/10.1016/j.susc.2004.05.093
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