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Dynamic void collapse in crystals : computational modelling and experiments

Author
NEMAT-NASSER, S1 ; OKINAKA, T1 ; NESTERENKO, V1 ; MINGQI LIU1
[1] Center of Excellence for Advanced Materials, Department of Applied Mechanics and Engineering Sciences, University of California at San Diego, La Jolla, CA 92093-0416, United States
Source

Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 1998, Vol 78, Num 5, pp 1151-1174 ; ref : 22 ref

ISSN
1364-2804
Scientific domain
Crystallography; Condensed state physics
Publisher
Taylor & Francis, London
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Amorçage fissure Cavité dans réseau Cuivre Déformation mécanique Déformation plastique Ecoulement Etude expérimentale Etude théorique Inélasticité Propagation fissure Simulation numérique Cu Métal transition
Keyword (en)
Crack formation Voids Copper Strains Plastic deformation Flow(fluid) Experimental study Theoretical study Inelasticity Crack propagation Digital simulation Transition elements
Keyword (es)
Inelasticidad
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60B Mechanical and acoustical properties of condensed matter / 001B60B20 Mechanical properties of solids / 001B60B20M Fatigue, brittleness, fracture, and cracks

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Pacs
6220M Fatigue, brittleness, fracture, and cracks

Discipline
Metals. Metallurgy Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1596373

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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