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Thermal stability and electronic structure of atomically uniform pb films on Si(111)

Author
UPTON, M. H1 2 ; WEI, C. M3 4 ; CHOU, M. Y4 ; MILLER, T1 2 ; CHIANG, T.-C1 2
[1] Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, 104 S. Goodwin Avenue, Urbana, Illinois 61801-2902, United States
[2] Department of Physics, University of Illinois at Urbana-Champaign, 1110 W Green Street, Urbana, Illinois 61801-3080, United States
[3] Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan, Province of China
[4] School of Physics, Georgia Institute of Technology, USA, Atlanta, Georgia 30332-0430, United States
Source

Physical review letters. 2004, Vol 93, Num 2, pp 026802.1-026802.4 ; ref : 16 ref

CODEN
PRLTAO
ISSN
0031-9007
Scientific domain
Optics; Atomic molecular physics; Condensed state physics; Physics; Plasma physics
Publisher
American Physical Society, Ridge, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Couche mince Energie totale Epaisseur Etude expérimentale Oscillation quantique Oscillation Plomb Recuit Résolution angulaire Spectre photoélectron Stabilité thermique Structure électronique Pb Substrat Si
Keyword (en)
Thin films Total energy Thickness Experimental study Quantum oscillation Oscillations Lead Annealing Angular resolution Photoelectron spectra Thermal stability Electronic structure
Keyword (es)
Oscilación cuántica
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C21 Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems / 001B70C21A Thin films and multilayers

Pacs
7321A Multilayers

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
15966107

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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