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The Hausdorff Voronoi diagram of point clusters in the plane

Author
PAPADOPOULOU, Evanthia1
[1] IBM TJ Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, United States
Source

Algorithmica. 2004, Vol 40, Num 2, pp 63-82, 20 p ; ref : 20 ref

ISSN
0178-4617
Scientific domain
Computer science
Publisher
Springer, New York, NY
Publication country
United States
Document type
Article
Language
English
Author keyword
Hausdorff distance Manufacturing defects Plane sweep. VLSI yield prediction VLSI critical area Via-blocks Voronoi diagram
Keyword (fr)
Analyse sensibilité Circuit VLSI Conception circuit Diagramme Voronoï Défaut fabrication Enveloppe convexe Balayage plan Distance Hausdorff Via block
Keyword (en)
Sensitivity analysis VLSI circuit Circuit design Voronoï diagram Manufacturing defect Convex hull
Keyword (es)
Análisis sensibilidad Circuito VLSI Diseño circuito Diagrama Voronoi Defecto fabricación Cápsula convexa
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02A Theoretical computing / 001D02A05 Algorithmics. Computability. Computer arithmetics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Discipline
Computer science : theoretical automation and systems Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
15984177

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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