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Molecular memories that survive silicon device processing and real-world operation

Author
ZHIMING LIU1 ; YASSERI, Amir A1 ; LINDSEY, Jonathan S2 ; BOCIAN, David F1
[1] Department of Chemistry, University of California, Riverside, CA 92521-0403, United States
[2] Department of Chemistry, North Carolina State University, Raleigh, NC 27695-8204, United States
Source

Science (Washington, D.C.). 2003, Vol 302, Num 5650, pp 1543-1545, 3 p

CODEN
SCIEAS
ISSN
0036-8075
Scientific domain
Multidisciplinary
Publisher
American Association for the Advancement of Science, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Atmosphère inerte Couche monomoléculaire Europium Complexe Matériau modifié Orientation cristalline Porphyrine métallique Propriété électrochimique Silicium Stockage information Zinc Complexe Lanthanide Complexe Métal transition Complexe
Keyword (en)
Inert atmosphere Monolayer Europium Complexes Modified material Crystal orientation Metalloporphyrin Electrochemical properties Silicon Information storage Zinc Complexes Lanthanide Complexes Transition metal Complexes
Keyword (es)
Atmósfera inerte Capa monomolecular Europio Complejo Material modificado Orientación cristalina Porfirina metálica Propiedad electroquímica Silicio Almacenamiento información Zinc Complejo Lantánido Complejo Metal transición Complejo
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03I Storage and reproduction of information / 001D03I03 Miscellaneous

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
15992716

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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