Direct methods determination of the Si(111)-(6 × 6)Au surface structure
- Author
- GROZEA, D1 ; LANDREE, E1 ; MARKS, L. D1 ; FEIDENHANS'L, R2 ; NIELSEN, M2 ; JOHNSON, R. L3
[1] Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, United States
[2] Department of Solid State Physics and Chemistry, Risø National Laboratory, 4000 Roskilde, Denmark
[3] II Institute for Experimental Physics, University of Hamburg, 22761 Hamburg, Germany - Source
Surface science. 1998, Vol 418, Num 1, pp 32-45 ; ref : 39 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Diffraction RX Etude expérimentale Méthode directe Or Ordre courte distance Ordre longue distance Pavage Silicium Structure adsorption Structure atomique Structure surface Au Si Métal transition
- Keyword (en)
- XRD Experimental study Direct method Gold Short-range order Long-range order Tiling Silicon Adsorption structure Atomic structure Surface structure Transition elements
- Keyword (es)
- Método directo Estructura adsorción
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1601518
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0039-6028(98)00660-8 
https://dx.doi.org/10.1016/S0039-6028(98)00660-8
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