Pascal and Francis Bibliographic Databases

Help

Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16082821

Export

Selection :

Distributed sleep transistor network for power reduction

Author
LONG, Changbo1 ; LEI HE1
[1] Department of Electrical Engineering, University of California, Los Angeles, CA 90034, United States
Source

IEEE transactions on very large scale integration (VLSI) systems. 2004, Vol 12, Num 9, pp 937-946, 10 p ; ref : 24 ref

ISSN
1063-8210
Scientific domain
Electronics
Publisher
Institute of Electrical and Electronics Engineers, Piscataway, NJ
Publication country
United States
Document type
Article
Language
English
Author keyword
Clustering low-control overhead low-power design low-voltage performance tradeoffs performance
Keyword (fr)
Basse tension Circuit VLSI Circuit intégré Conception assistée Conception circuit Electronique faible puissance Etude comparative Evaluation performance Implantation(topométrie) Module multipuce Porte logique Résultat expérimental Synthèse circuit Système réparti Transistor
Keyword (en)
Low voltage VLSI circuit Integrated circuit Computer aided design Circuit design Low-power electronics Comparative study Performance evaluation Layout Multichip module Logic gate Experimental result Circuit synthesis Distributed system Transistor
Keyword (es)
Baja tensión Circuito VLSI Circuito integrado Concepción asistida Diseño circuito Estudio comparativo Evaluación prestación Implantación(topometría) Modulo multipulga Puerta lógica Resultado experimental Síntesis circuito Sistema repartido Transistor
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16082821

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Access to the document

Searching the Web