On the number of overload-induced delay cycles as a function of thickness
- Author
- MCEVILY, A. J1 ; ISHIHARA, S2 ; MUTOH, Y3
[1] Department of Material Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, CT, United States
[2] Department of Mechanical Engineering, Toyama University, Toyama, Japan
[3] Department Department of Mechanical Engineering, Nagaoka University of Technology, Nagaoka, Japan - Source
International journal of fatigue. 2004, Vol 26, Num 12, pp 1311-1319, 9 p ; ref : 22 ref
- CODEN
- IJFADB
- ISSN
- 0142-1123
- Scientific domain
- Mechanical engineering; Metallurgy, welding; Polymers, paint and wood industries
- Publisher
- Elsevier Science, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- Crack closure Effect of thickness Fatigue crack growth Overloads
- Keyword (fr)
- Effet fermeture fissure Epaisseur Fatigue Fissure fatigue Propagation fissure Propriété mécanique Retard Sursollicitation
- Keyword (en)
- Crack closure effect Thickness Fatigue Fatigue crack Crack propagation Mechanical properties Delay Overloading
- Keyword (es)
- Efecto ciere fisura Espesor Fatiga Fisura fatiga Propagación fisura Propiedad mecánica Retraso Sobrecarga
- Keyword (de)
- Rissschliessungseffekt Dicke Ermuedung Ermuedungsriss Rissausbreitung Verzoegerung Ueberlastung
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11G Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology / 001D11G03 Fatigue
- Discipline
- Metals. Metallurgy
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16180971
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.ijfatigue.2004.04.008 
https://dx.doi.org/10.1016/j.ijfatigue.2004.04.008
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