RF sputtered electrochromic V2O5 films
- Author
- OTTAVIANO, L1 ; PENNISI, A1 2 ; SIMONE, F2 3 ; SALVI, A. M4
[1] Istituto per la Microelettronica e Microsistemi, CNR, 195121 Catania, Italy
[2] Istituto Nazionale per la Fisica della Materia, Sezione di Catania, Italy
[3] Dipartimento di Fisica, dell'Università di Catania, 195123 Catania, Italy
[4] Dipartimento di Chimica dell'Università della Basilicata, 185100 Potenza, Italy - Source
Optical materials (Amsterdam). 2004, Vol 27, Num 2, pp 307-313, 7 p ; ref : 20 ref
- ISSN
- 0925-3467
- Scientific domain
- Optics; Condensed state physics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé binaire Diffraction RX Electrochromisme Etude expérimentale Facteur transmission Microstructure Propriété optique RBS Spectrométrie photoélectron Vanadium oxyde O V V2O5
- Keyword (en)
- Binary compounds XRD Electrochromism Experimental study Transmittance Microstructure Optical properties RBS Photoelectron spectroscopy Vanadium oxides
- Keyword (es)
- Factor transmisión
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B70 Optical materials
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16189940
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.optmat.2004.04.001 
https://dx.doi.org/10.1016/j.optmat.2004.04.001
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