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Photoelectron spectroscopy versus absorption spectroscopy for quantitative characterization of nanometric powders coated with an overlayer

Author
SANCHEZ-LOPEZ, J. C1 ; FERNANDEZ, A1
[1] Instituto de Ciencia de Materiales de Sevilla and Dpto. Química Inorgánica, Centro de Investigaciones Cientificas Isla de la Cartuja, Avda. Américo Vespucio s/n, 41092 Sevilla, Spain
Source

Surface and interface analysis. 1998, Vol 26, Num 13, pp 1016-1026 ; ref : 26 ref

CODEN
SIANDQ
ISSN
0142-2421
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Aluminium oxyde Aluminium Echelle nanométrique Effet dimensionnel Etude expérimentale Etude théorique Poudre ultrafine Rayon X Spectre RX Spectre absorption Spectrométrie perte énergie électron Spectrométrie photoélectron Surcouche Texture Al O Al2O3 Al Composé minéral
Keyword (en)
Aluminium oxide Aluminium Nanometer scale Size effect Experimental study Theoretical study Ultrafine powder X ray X ray spectrum Absorption spectrum EEL spectroscopy Photoelectron spectrometry Overlayers Texture Inorganic compound
Keyword (es)
Aluminio óxido Aluminio Efecto dimensional Estudio experimental Estudio teórico Polvo ultrafino Rayos X Espectro RX Espectro de absorción Espectrometría fotoelectrón Textura Compuesto inorgánico
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01J Colloidal state and disperse state / 001C01J07 Powders

Discipline
General chemistry and physical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1620333

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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