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Electronic structures of filled tetrahedral semiconductors LiMgN and LiZnN: conduction band distortion

Author
YU, L. H1 ; YAO, K. L1 2 ; LIU, Z. L1
[1] Department of Physics and State Key Laboratory of Laser Technology, Huazhong University of Science and Technology, WuHan 430074, China
[2] International Center of Materials Physics, Chinese Academy of Science, ShengYang 110015, China
Source

Physica. B, Condensed matter. 2004, Vol 353, Num 3-4, pp 278-286, 9 p ; ref : 28 ref

ISSN
0921-4526
Scientific domain
Crystallography; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
31.15.Ew FP-LAPW method 71.20.-b 71.20.Nr Conduction band Direct and indirect band gap Semiconductor
Keyword (fr)
Calcul APW Energie totale Liaison covalente Liaison ionique Méthode fonctionnelle densité Nitrure Semiconducteur Structure bande Structure électronique Zone Brillouin Ga N GaN Zn Composé minéral Métal transition
Keyword (en)
APW calculations Total energy Covalent bonds Ionic bonds Density functional method Nitrides Semiconductor materials Band structure Electronic structure Brillouin zones Inorganic compounds Transition elements
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A20 Electron density of states and band structure of crystalline solids / 001B70A20N Semiconductor compounds

Pacs
7120N Semiconductor compounds

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16333390

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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