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Observation of the spin Hall effect in semiconductors

Author
KATO, Y. K1 ; MYERS, R. C1 ; GOSSARD, A. C1 ; AWSCHALOM, D. D1
[1] Center for Spintronics and Quantum Computation, University of California, Santa Barbara, CA 93106, United States
Source

Science (Washington, D.C.). 2004, Vol 306, Num 5703, pp 1910-1913, 4 p

CODEN
SCIEAS
ISSN
0036-8075
Scientific domain
Multidisciplinary
Publisher
American Association for the Advancement of Science, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Composé binaire Composé ternaire Contrainte mécanique Couche mince Couche épitaxique Effet Hall Effet Kerr Gallium arséniure Image Indium arséniure Microscopie Orientation cristalline Polarisation spin Semiconducteur Transport polarisé en spin Effet Hall spin
Keyword (en)
Binary compounds Ternary compounds Mechanical stress Thin films Epitaxial layers Hall effect Kerr effect Gallium arsenides Images Indium arsenides Microscopy Crystal orientation Spin polarization Semiconductor materials Spin polarized transport Spin Hall effect
Keyword (es)
Tensión mecánica Polarización spin
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70B Electronic transport in condensed matter / 001B70B25 Spin polarized transport

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C40 Electronic transport in interface structures / 001B70C40H Quantum hall effect (including fractional)

Pacs
7225 Spin polarized transport

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16380431

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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