Multiobjective optimization of VLSI interconnect parameters
- Author
- ANAND, M. B1 ; SHIBATA, H1 ; KAKUMU, M2
[1] ULSI Process Engineering Laboratory, Advanced Microelectronics Center, Toshiba Corp., Yokohama 235, Japan
[2] Microprocessor Product Engineering Department, Micro & Custom LSI Division, Toshiba Corp., Kawasaki 210, Japan - Source
IEEE transactions on computer-aided design of integrated circuits and systems. 1998, Vol 17, Num 12, pp 1252-1261 ; ref : 17 ref
- CODEN
- ITCSDI
- ISSN
- 0278-0070
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Chemin critique Circuit VLSI Circuit intégré Conception assistée Interconnexion Modélisation Optimisation Programmation non linéaire Puce électronique Optimisation multiobjectif
- Keyword (en)
- Critical path VLSI circuit Integrated circuit Computer aided design Interconnection Modeling Optimization Non linear programming Chip Multiobjective optimization
- Keyword (es)
- Recorrido crítico Circuito VLSI Circuito integrado Concepción asistida Interconexión Modelización Optimización Programación no lineal Pulga electrónica
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1641958
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/43.736565 
https://dx.doi.org/10.1109/43.736565
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