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Characteristics of low-temperature-grown GaN films on Si(111)

Autor
HASSAN, Z1 ; LEE, Y. C1 ; YAM, F. K1 ; IBRAHIM, K1 ; KORDESCH, M. E2 ; HALVERSON, W3 ; COLTER, P. C3
[1] School of Physics, Universiti Sains Malaysia, Minders, Gelugor, Penang 11800, Malaysia
[2] Department of Physics and Astronomy, Ohio University, Athens, OH, United States
[3] Spire Corporation, Bedford, MA, United States
Fuente

Solid state communications. 2005, Vol 133, Num 5, pp 283-287, 5 p ; ref : 18 ref

CODEN
SSCOA4
ISSN
0038-1098
Campo Científico
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Editor
Elsevier, Oxford
País de la publicación
United Kingdom
Tipo de documento
Article
Idioma
English
Palabra clave de autor
61.10.-i 73.61.Ey A. Semiconductors 81.15.Gh B. Crystal growth C. X-ray diffraction D. Electrical properties
Palabra clave (fr)
Analyse structurale Barrière Schottky Caractéristique courant tension Chrome Composé minéral Diffraction RX Effet redresseur Gallium nitrure Hauteur barrière Hétérostructure Microscopie force atomique Microscopie électronique balayage Méthode MOCVD Nickel RBS Résonance cyclotronique électronique Semiconducteur Silicium Spectre RX Spectrométrie dispersive 7330 Ga N GaN Si
Palabra clave (in)
Structural analysis Schottky barriers IV characteristic Chromium Inorganic compounds XRD Rectification Gallium nitrides Barrier height Heterostructures Atomic force microscopy Scanning electron microscopy MOCVD Nickel RBS Electron cyclotron-resonance Semiconductor materials Silicon X-ray spectra Dispersive spectrometry
Palabra clave (es)
Análisis estructural Espectrometría dispersiva
Clasificación
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C30 Surface double layers, schottky barriers, and work functions

Disciplina
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Procedencia
Inist-CNRS
Base de datos
PASCAL
Identificador INIST
16447444

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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