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Tz constraints of semi-elliptical surface cracks in elastic plates subjected to uniform tension loading

Author
BIN ZHANG1 ; WANLIN GUO1
[1] Institute of Nano Science, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China
Source

International journal of fracture. 2005, Vol 131, Num 2, pp 173-187, 15 p ; ref : 1 p.1/4

CODEN
IJFRAP
ISSN
0376-9429
Scientific domain
Mechanics acoustics; Metallurgy, welding
Publisher
Springer, Heidelberg
Publication country
Germany
Document type
Article
Language
English
Author keyword
Out-of-plane constraint Tz semi-elliptical surface crack three-dimensional finite element
Keyword (fr)
Aménagement intérieur Analyse contrainte Coefficient Poisson Constante élasticité Extrémité fissure Fissure superficielle Goutte Module déformation Modélisation Méthode élément fini Plaque fissurée Rapport aspect Surface libre Surface plane
Keyword (en)
Disposition of a building Stress analysis Poisson ratio Elastic constant Crack tip Surface crack Drop Deformation modulus Modeling Finite element method Cracked plate Aspect ratio Free surface Plane surface
Keyword (es)
Acondicionamiento interior Análisis tensión Coeficiente Poisson Constante elasticidad Extremidad fisura Fisura superficial Gota Módulo deformación Modelización Método elemento finito Placa agrietada Relación dimensional Superficie libre Superficie plana
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40F Solid mechanics / 001B40F30 Structural and continuum mechanics / 001B40F30N Fracture mechanics (crack, fatigue, damage...)

Discipline
Physics : solid mechanics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16464845

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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