Techniques de piégeage d'ions
- Other title
- Ion trap techniques (en)
- Author
- SCHERMANN, Jean-Pierre1 ; VEDEL, Michel2
[1] Université Paris-Nord, France
[2] Université Aix-Marseille, France - Source
Techniques de l'ingénieur. Analyse et caractérisation. 1992, Vol P3, Num P2617, pp P2617.1-P2617.9 ; ref : 8 ref
- ISSN
- 1762-8717
- Scientific domain
- Analytical chemistry
- Publisher
- Techniques de l'ingénieur, Paris
- Publication country
- France
- Document type
- Article
- Language
- French
- Keyword (fr)
- Application Confinement Etude comparative Piège Penning Piégeage ion Spectrométrie ion Piège de Paul
- Keyword (en)
- Application Confinement Comparative study Penning trap Ion trapping Ion spectroscopy
- Keyword (es)
- Aplicación Estudio comparativo Captura Penning Captura ión
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics / 001B30G Mechanical control of atoms, molecules and ions / 001B30G20 Atomic and molecular beam sources and techniques
- Discipline
- Atomic and molecular physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16531167
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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