Robust system design with built-in soft-error resilience
- Author
- MITRA, Subhasish1 ; SEIFERT, Norbert1 ; MING ZHANG1 ; QUAN SHI1 ; KEE SUP KIM1
[1] Intel, United States - Source
Computer (Long Beach, CA). 2005, Vol 38, Num 2, pp 43-52, 10 p ; ref : 20 ref
- ISSN
- 0018-9162
- Scientific domain
- Computer science
- Publisher
- IEEE Computer Society, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Conception système Erreur soft Estimation erreur Rayonnement terrestre Réponse transitoire Résilience Réutilisation Taux erreur Technologie avancée Testabilité
- Keyword (en)
- System design Soft error Error estimation Terrestrial radiation Transient response Resilience Reuse Error rate Advanced technology Testability
- Keyword (es)
- Concepción sistema Error soft Estimación error Radiación terrestre Respuesta transitoria Resiliencia Reutilización Indice error Tecnología avanzada Testabilidad
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B10 Computer systems performance. Reliability
- Discipline
- Computer science : theoretical automation and systems
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16542535
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/MC.2005.70 
https://dx.doi.org/10.1109/MC.2005.70
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