Novel concepts for reliability technology
- Author
- RYU, Dongsu1 ; CHANG, Seogweon2
[1] Reliability Laboratory, CS Management Center, Samsung Electronics Co., Ltd, 416, Maetan-3 Dong, Paldal-Gu, Suwon-City, Gyeonggi-Do 442 742, Korea, Republic of
[2] Reliability Analysis Research Center, 402 HIT, Hanyang Universit, 17 Haengdang-Dong, Seungdong-ku, Seoul, 133-791, Korea, Republic of - Source
Microelectronics and reliability. 2005, Vol 45, Num 3-4, pp 611-622, 12 p ; ref : 25 ref
- CODEN
- MCRLAS
- ISSN
- 0026-2714
- Scientific domain
- Electronics
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse dommage Durabilité Défaillance Fiabilité Taux défaillance Temps moyen avant défaillance
- Keyword (en)
- Failure analysis Durability Failures Reliability Failure rate Mean time to failure
- Keyword (es)
- Análisis avería Durabilidad Fallo Fiabilidad Porcentaje falla Tiempo medio antes fenecimiento
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16545545
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.microrel.2004.10.010 
https://dx.doi.org/10.1016/j.microrel.2004.10.010
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