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Preconditioning, write width, and recording properties of Co-Cr-Pt-O perpendicular media with various underlayer designs

Author
ABARRA, E. Noel1 ; GILL, Paramjit1 ; MIN ZHENG1 ; ZHOU, J. N1 ; RAMAMURTHY ACHARYA, B1 ; CHOE, Gunn1
[1] MMC Technology, San Jose, CA 95131, United States
Conference name
Annual Magnetic Recording Conference (TRMC 2004) (TRMC 2004) (15 ; Boulder, Colorado 2004-08-11)
Source

IEEE transactions on magnetics. 2005, Vol 41, Num 2, pp 581-586, 6 p ; ref : 13 ref

CODEN
IEMGAQ
ISSN
0018-9464
Scientific domain
Electronics; Metallurgy, welding; Condensed state physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Author keyword
AC erase magnetic write width (MWW) perpendicular media preconditioning recording properties soft underlayer (SUL)
Keyword (fr)
Couche interfaciale Enregistrement magnétique Largeur
Keyword (en)
Interfacial layer Magnetic recording Width
Keyword (es)
Capa interfacial
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A90 Other topics in materials science

Discipline
Physics and materials science
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
16548334

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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